Regression Conformal Prediction under Bias

Authors: Matt Y. Cheung, Tucker J. Netherton, Laurence E. Court, Ashok Veeraraghavan, Guha Balakrishnan

Abstract: Uncertainty quantification is crucial to account for the imperfect
predictions of machine learning algorithms for high-impact applications.
Conformal prediction (CP) is a powerful framework for uncertainty
quantification that generates calibrated prediction intervals with valid
coverage. In this work, we study how CP intervals are affected by bias – the
systematic deviation of a prediction from ground truth values – a phenomenon
prevalent in many real-world applications. We investigate the influence of bias
on interval lengths of two different types of adjustments — symmetric
adjustments, the conventional method where both sides of the interval are
adjusted equally, and asymmetric adjustments, a more flexible method where the
interval can be adjusted unequally in positive or negative directions. We
present theoretical and empirical analyses characterizing how symmetric and
asymmetric adjustments impact the “tightness” of CP intervals for regression
tasks. Specifically for absolute residual and quantile-based non-conformity
scores, we prove: 1) the upper bound of symmetrically adjusted interval lengths
increases by $2|b|$ where $b$ is a globally applied scalar value representing
bias, 2) asymmetrically adjusted interval lengths are not affected by bias, and
3) conditions when asymmetrically adjusted interval lengths are guaranteed to
be smaller than symmetric ones. Our analyses suggest that even if predictions
exhibit significant drift from ground truth values, asymmetrically adjusted
intervals are still able to maintain the same tightness and validity of
intervals as if the drift had never happened, while symmetric ones
significantly inflate the lengths. We demonstrate our theoretical results with
two real-world prediction tasks: sparse-view computed tomography (CT)
reconstruction and time-series weather forecasting. Our work paves the way for
more bias-robust machine learning systems.

Source: http://arxiv.org/abs/2410.05263v1

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